{"id":3849,"date":"2021-10-01T09:21:59","date_gmt":"2021-10-01T07:21:59","guid":{"rendered":"http:\/\/www.lac.universite-paris-saclay.fr\/?page_id=3849"},"modified":"2023-04-20T17:35:02","modified_gmt":"2023-04-20T15:35:02","slug":"hreelm_test","status":"publish","type":"page","link":"http:\/\/www.lac.universite-paris-saclay.fr\/?page_id=3849","title":{"rendered":"HREELM (High-Resolution Electron-Energy-Loss Microscope )"},"content":{"rendered":"

Microscope \u00e0 haute r\u00e9solution \u00e0 perte d’\u00e9nergie d’\u00e9lectrons<\/h3>\n\n\n
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L’objectif du projet (r\u00e9alis\u00e9 en collaboration avec SPEC et ISMO) est de construire et de tester un microscope \u00e9lectronique \u00e0 basse \u00e9nergie et \u00e0 haute r\u00e9solution spectrale (HREELM). Il permettra l’imagerie microscopique des \u00e9tats vibrationnels des surfaces. Les principaux \u00e9l\u00e9ments cl\u00e9s du nouvel instrument, tels que la source d’\u00e9lectrons monochromatiques \u00e0 haute luminosit\u00e9 et le d\u00e9tecteur rapide, sont d\u00e9j\u00e0 financ\u00e9s et sont en cours de d\u00e9veloppement [Man19]. Une optique \u00e9lectronique innovante a \u00e9t\u00e9 simul\u00e9e. La figure montre un sch\u00e9ma de ce qui pourrait \u00eatre le prototype HREELM capable de faire de l’imagerie plein champ des pertes d’\u00e9nergie des \u00e9lectrons de faible \u00e9nergie avec une r\u00e9solution spatiale nanom\u00e9trique (20 nm) comme dans un LEEM et spectrale \u00e9lev\u00e9e (<10 meV) comme dans un HREELS. HREELM contient une nouvelle source d’\u00e9lectrons monochromatiques (\u00e9tudi\u00e9e ici au LAC), une optique \u00e9lectronique d\u00e9di\u00e9e (une partie est visible incluant le s\u00e9parateur de faisceau magn\u00e9tique \u00e0 90\u00b0), une d\u00e9tection par temps de vol et des d\u00e9tecteurs de temps et de position \u00e0 haute efficacit\u00e9. L’extraction pixel par pixel des spectres vibratoires produira une pile de donn\u00e9es 3D (x,y,\u00e9nergie). <\/p>\n\n\n\n

\"\"<\/figure><\/div>\n\n\n\n

R\u00e9cemment, nous avons d\u00e9montr\u00e9, dans le cadre du projet ANR\/DFG HREELM (2014-2019) [Fed20], que l’utilisation d’un renforcement r\u00e9sonant de la photoionisation [Mou17] peut produire un faisceau d’\u00e9lectrons utile pour HREELM. Et dans un r\u00e9cent travail de th\u00e8se [Hahn21], nous avons montr\u00e9 que cette source peut effectivement produire un faisceau puls\u00e9 de 100 pA, avec une dur\u00e9e d’impulsion de dt ~ 500 ps \u00e0 quelques MHz. Notre travail actuel consiste \u00e0 utiliser ce faisceau dans une version v1 de HREELM avant de construire l’appareil complet.<\/p>\n\n\n\n

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R\u00e9f\u00e9rences :<\/strong><\/p>\n\n\n\n

[Fed20] Fedchenko, O., S. Chernov, G. Sch\u00f6nhense, R. Hahn, et D. Comparat. \u00ab Narrow-band pulsed electron source based on near-threshold photoionization of Cs in a magneto-optical trap \u00bb. Phys.Rev.A 101, 1 (2020): 013424. https:\/\/hal.archives-ouvertes.fr\/hal-03021231\/file\/PhysRevA.101.013424.pdf<\/a><\/p>\n\n\n\n

[Mou17] E. Moufarej, M. Vielle-Grosjean, G. Khalili, A. J. McCulloch, F. Robicheaux, Y. J. Picard, et D. Comparat.; Forced field ionization of Rydberg states for the production of monochromatic beams; Phys.Rev.A 95, (2017). https:\/\/doi.org\/10.1103\/PhysRevA.95.043409<\/a><\/p>\n\n\n\n

[Hahn21] H. Rapha\u00ebl. \u00ab Ionisation of caesium Rydberg atoms for a mono-chromatic electron source for applications in electron microscopy and spectroscopy \u00bb. Theses, Universit\u00e9 Paris-Saclay, 2021. https:\/\/tel.archives-ouvertes.fr\/tel-03176839<\/a>.<\/p>\n\n\n\n

[Man19] M. Mankos K. Shadman, R. Hahn, Y. J. Picard, D. Comparat, O. Fedchenko, G. Sch\u00f6nhense, L., A. Lafosse, and N. Barrett, Design for a high resolution electron energy loss microscope, Ultramicroscopy 207, 112848 (2019) doi.org\/10.1016\/j.ultramic.2019.112848. <\/p>\n","protected":false},"excerpt":{"rendered":"

Microscope \u00e0 haute r\u00e9solution \u00e0 perte d’\u00e9nergie d’\u00e9lectrons L’objectif du projet (r\u00e9alis\u00e9 en collaboration avec SPEC et ISMO) est de construire et de tester un microscope \u00e9lectronique \u00e0 basse \u00e9nergie … Continue reading “HREELM (High-Resolution Electron-Energy-Loss Microscope )”<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":3954,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-3849","page","type-page","status-publish","has-post-thumbnail","hentry"],"featured_image_src":"http:\/\/www.lac.universite-paris-saclay.fr\/wp-content\/uploads\/2021\/12\/HREELM_cr.png","yoast_head":"\nHREELM (High-Resolution Electron-Energy-Loss Microscope ) - LAC<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"http:\/\/www.lac.universite-paris-saclay.fr\/?page_id=3849\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:title\" content=\"HREELM (High-Resolution Electron-Energy-Loss Microscope ) - 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