{"id":3840,"date":"2021-10-01T09:11:40","date_gmt":"2021-10-01T07:11:40","guid":{"rendered":"http:\/\/www.lac.universite-paris-saclay.fr\/?page_id=3840"},"modified":"2024-02-05T17:33:34","modified_gmt":"2024-02-05T16:33:34","slug":"siec_test","status":"publish","type":"page","link":"http:\/\/www.lac.universite-paris-saclay.fr\/?page_id=3840","title":{"rendered":"SIEC (Source d\u2019Ions et d\u2019Electrons Corr\u00e9l\u00e9s)"},"content":{"rendered":"

Source d\u2019Ions et d\u2019Electrons Corr\u00e9l\u00e9S<\/span><\/h1><\/div><\/div><\/div>\n\n
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Description <\/div>\n\t\t\t<\/div><\/div>\n\t\t\t<\/div>\n\t\t\t
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Source d\u00e9terministe ion par ion <\/strong>

\nLa production d\u00e9terministe d’ions individuels ainsi que le contr\u00f4le de leur trajectoire ion par ion ont \u00e9t\u00e9 r\u00e9cemment r\u00e9alis\u00e9s pour la premi\u00e8re fois au LAC [Lop19, HiPhy]. En utilisant la corr\u00e9lation entre l’ion et l’\u00e9lectron, issus de la photoionisation d\u2019atomes de c\u00e9sium [Hah21], notre \u00e9quipe a d\u00e9velopp\u00e9 un syst\u00e8me de r\u00e9troaction rapide pour contr\u00f4ler en temps r\u00e9el la trajectoire des ions (Figure #TC1). A partir de la position de l\u2019\u00e9lectron, on peut pr\u00e9dire la position d\u2019arriv\u00e9e de l\u2019ion corr\u00e9l\u00e9 et agir en temps r\u00e9el sur sa trajectoire afin de l\u2019envoyer \u00e0 n\u2019importe quel endroit souhait\u00e9 sur la cible (Figure #TC2). Ceci permet \u00e0 la fois de cr\u00e9er une source d\u00e9terministe d\u2019ion unique \u2013 en ne laissant passer l\u2019ion que s\u2019il satisfait des crit\u00e8res d\u00e9finis par l\u2019exp\u00e9rimentateur \u2013 et de contr\u00f4ler sa trajectoire pour qu\u2019il arrive \u00e0 l\u2019endroit choisi sur la cible, ce qui n\u2019avait jamais \u00e9t\u00e9 fait auparavant. Ce dispositif permet donc de surpasser les limites de l\u2019optique ionique classique en ajoutant, \u00e0 la focalisation de la source d\u2019ions, la correction des trajectoires individuelles de chaque ion.\n\n\n<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n

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Figure #TC1\u00a0: (Gauche) : Sch\u00e9ma du montage exp\u00e9rimental. Les \u00e9lectrons et les ions, produits par photo-ionisation d’un jet de c\u00e9sium, sont extraits dans des directions oppos\u00e9es et d\u00e9tect\u00e9s par deux d\u00e9tecteurs sensibles en temps et position (TPSD). Le syst\u00e8me d’acquisition g\u00e8re les informations provenant des d\u00e9tecteurs et traite les donn\u00e9es. Selon le type de correction appliqu\u00e9e, le syst\u00e8me de r\u00e9troaction contr\u00f4le les trajectoires des ions en appliquant sur les plaques d\u00e9flectrices les tensions appropri\u00e9es pour chaque ion. (Droite haut)\u00a0: Images brutes donn\u00e9es par les d\u00e9tecteurs de position des \u00e9lectrons (Xe,Ye) et des ions (Xi,Yi) apr\u00e8s une accumulation de plusieurs milliers de coups ; (Droite bas)\u00a0: Courbes de corr\u00e9lations des coordonn\u00e9es horizontale (Xi,Xe) et verticale (Yi,Ye) des ions et des \u00e9lectrons co\u00efncidents.<\/figcaption><\/figure><\/div>\n<\/div>\n\n\n\n
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Figure #TC2\u00a0: Images brutes des ions sur le d\u00e9tecteur avec correction 2D (a), avec une correction complexe (b), avec masque virtuel (c). Voir [Lop19<\/em>] pour plus de d\u00e9tails.<\/figcaption><\/figure><\/div>\n<\/div>\n<\/div>\n\n\n\n
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Imagerie Fant\u00f4me<\/strong>

\nGr\u00e2ce \u00e0 la corr\u00e9lation entre les paires \u00e9lectron\/ion de cette source d\u00e9terministe, notre \u00e9quipe a de plus r\u00e9alis\u00e9 des exp\u00e9riences d\u2019imagerie fant\u00f4me (ghost imaging) avec des ions et des \u00e9lectrons [Tri20]. Cette imagerie fant\u00f4me permet d\u2019observer ce qui se trouve sur le trajet du spot d\u2019ions en exploitant l\u2019image obtenue avec les \u00e9lectrons corr\u00e9l\u00e9s. La d\u00e9monstration a \u00e9t\u00e9 faite au LAC qu’il est possible, en utilisant l’imagerie du d\u00e9tecteur des \u00e9lectrons, de r\u00e9v\u00e9ler des d\u00e9tails de structures inaccessibles \u00e0 la r\u00e9solution en position du d\u00e9tecteur des ions. La figure #GI montre qu\u2019en exploitant la corr\u00e9lation \u00e9lectron\/ion on r\u00e9v\u00e8le, via les \u00e9lectrons, l’image fant\u00f4me (c’est \u00e0 dire l’image en ne gardant que les \u00e9lectrons corr\u00e9l\u00e9s au signal des ions) des structures d\u2019un masque \u00e0 transmission vu par les ions alors m\u00eame que ses structures (de l\u2019ordre du mm) sont bien plus petites que le spot des ions (~ 20 mm). Cette technique, coupl\u00e9e \u00e0 un dispositif d\u2019imagerie par faisceau d\u2019ion, permettra d\u2019am\u00e9liorer la r\u00e9solution en exploitant le surplus d\u2019information apport\u00e9e par la corr\u00e9lation avec les \u00e9lectrons co\u00efncidents.\n\n\n<\/p>\n\n\n\n

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Figure #GI\u00a0: Sch\u00e9ma du dispositif exp\u00e9rimental dans la configuration d’imagerie fant\u00f4me (Ghost Imaging) d\u00e9montr\u00e9e au LAC [Tri20<\/em>]. a) : Image vue par le d\u00e9tecteur pour tous les \u00e9lectrons. b) : Image pour les \u00e9lectrons qui sont d\u00e9tect\u00e9s en co\u00efncidence avec leur ion corr\u00e9l\u00e9, ce qui signifie que ces \u00e9lectrons sont conserv\u00e9s uniquement lorsqu’ils sont en co\u00efncidence avec un ion arriv\u00e9 sur le d\u00e9tecteur d’ions (qui n’a pas aucune capacit\u00e9 d’imagerie). En raison de la correspondance entre les positions des \u00e9lectrons et des ions, la capacit\u00e9 d’imagerie du d\u00e9tecteur d’\u00e9lectrons r\u00e9v\u00e8le le motif vu par les ions. c) Image du masque plac\u00e9 sur la trajectoire des ions.


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R\u00e9f\u00e9rences :<\/strong><\/p>\n\n\n\n

[Lop19<\/em>]<\/p>\n\n\n\n

Real-time trajectory control of deterministically produced ions<\/p>\n\n\n\n

C. Lopez, A. Trimeche, D. Comparat and Y.J. Picard<\/p>\n\n\n\n

Phys. Rev. Applied 11 064049 (2019)<\/p>\n\n\n\n

[hal-02498878] [arXiv:2003.02186]<\/p>\n\n\n\n

[Tri20<\/em>]<\/p>\n\n\n\n

Ion and electron ghost imaging<\/p>\n\n\n\n

A. Trimeche, C. Lopez, D. Comparat and Y. J. Picard<\/p>\n\n\n\n

Phys. Rev. Research 2, 043295 (2020)<\/p>\n\n\n\n

arXiv:1812.09039v2 (2019)<\/p>\n\n\n\n

[HiPhy<\/em>]<\/p>\n\n\n\n

HighLight in Physics, How to Guide Each Ion in a Beam: A new ion beam system provides individualized control over every ion\u2019s trajectory as it moves toward a target.
https:\/\/physics.aps.org\/articles\/v12\/70<\/a><\/p>\n\n\n\n

[Hah21<\/em>]<\/p>\n\n\n\n

Cesium Rydberg-state ionization study by three-dimensional ion-electron correlation: Toward a monochromatic electron source<\/p>\n\n\n\n

R. Hahn, A. Trimeche, C. Lopez, D. Comparat and Y.J. Picard<\/p>\n\n\n\n

Phys. Rev. A 103, 042821 (2021)<\/p>\n\n\n

[hal-03017763]<\/p>\n\n<\/div><\/div>\n\t\t<\/div>\n\n\n

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